--------------------------------------- nejdříve sda --------------------------------------- smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG HD103UJ Serial Number: S13PJ9AQC03115 Firmware Version: 1AA01113 User Capacity: 1 000 204 886 016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 3b Local Time is: Sun Sep 6 12:10:31 2009 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (11471) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 192) minutes. Conveyance self-test routine recommended polling time: ( 21) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 076 076 011 Pre-fail Always - 7970 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 47 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 6203 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 47 13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 0 183 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 6 184 Unknown_Attribute 0x0033 098 098 000 Pre-fail Always - 2 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 188 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0022 075 059 000 Old_age Always - 25 (Lifetime Min/Max 25/28) 194 Temperature_Celsius 0x0022 074 058 000 Old_age Always - 26 (Lifetime Min/Max 25/28) 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 20417998 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 142 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 6 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 6 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 3f eb 3d 8f e7 Error: ICRC, ABRT 63 sectors at LBA = 0x078f3deb = 126828011 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 2a 3d 8f e7 08 23:25:57.110 READ DMA c8 00 00 2a 3c 8f e7 08 23:25:57.090 READ DMA c8 00 00 2a 3b 8f e7 08 23:25:57.070 READ DMA c8 00 00 2a 3a 8f e7 08 23:25:57.050 READ DMA c8 00 00 2a 39 8f e7 08 23:25:57.030 READ DMA Error 5 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 0f 53 f5 f9 e3 Error: ICRC, ABRT 15 sectors at LBA = 0x03f9f553 = 66712915 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 00 62 f4 f9 e3 08 07:24:22.840 READ DMA c8 00 10 d2 90 0b e4 08 07:24:22.790 READ DMA c8 00 f8 da 8f 0b e4 08 07:24:22.780 READ DMA c8 00 00 da 8e 0b e4 08 07:24:22.770 READ DMA ea 00 00 19 59 70 a0 08 07:24:22.750 FLUSH CACHE EXIT Error 4 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 d0 00 00 00 00 a0 at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 00 38 fa 4e 1b ed 08 00:48:39.890 WRITE DMA ca 00 08 f2 3e 1b ed 08 00:48:39.870 WRITE DMA ca 00 a0 4a 36 1b ed 08 00:48:39.870 WRITE DMA ca 00 08 82 24 1b ed 08 00:48:39.810 WRITE DMA ca 00 00 e2 15 1b ed 08 00:48:39.790 WRITE DMA Error 3 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 04 53 7d 85 6c bf ec Error: ABRT at LBA = 0x0cbf6c85 = 213871749 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 00 a8 5a 6c bf ec 08 6d+21:09:08.620 WRITE DMA ca 00 08 52 60 bf ec 08 6d+21:09:08.610 WRITE DMA ca 00 08 ea 3f bf ec 08 6d+21:09:08.550 WRITE DMA ca 00 08 82 1f bf ec 08 6d+21:09:08.480 WRITE DMA ca 00 08 1a ff be ec 08 6d+21:09:08.420 WRITE DMA Error 2 occurred at disk power-on lifetime: 0 hours (0 days + 0 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 00 d0 00 00 00 00 a0 at LBA = 0x00000000 = 0 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 00 08 e2 18 87 ec 08 4d+23:10:24.510 WRITE DMA ca 00 08 1a e4 86 ec 08 4d+23:10:24.460 WRITE DMA ca 00 d8 a2 c8 86 ec 08 4d+23:10:24.390 WRITE DMA ca 00 08 9a b4 86 ec 08 4d+23:10:24.370 WRITE DMA ca 00 50 32 94 86 ec 08 4d+23:10:24.370 WRITE DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. --------------------------------------- následuje sdb --------------------------------------- smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG HD103UJ Serial Number: S13PJ9AQC03116 Firmware Version: 1AA01113 User Capacity: 1 000 204 886 016 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 3b Local Time is: Sun Sep 6 12:10:42 2009 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (11772) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 197) minutes. Conveyance self-test routine recommended polling time: ( 21) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 078 078 011 Pre-fail Always - 7550 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 45 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0 9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 6201 10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 45 13 Read_Soft_Error_Rate 0x000e 100 100 000 Old_age Always - 0 183 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 6 184 Unknown_Attribute 0x0033 100 100 000 Pre-fail Always - 0 187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0 188 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0 190 Airflow_Temperature_Cel 0x0022 075 066 000 Old_age Always - 25 (Lifetime Min/Max 25/28) 194 Temperature_Celsius 0x0022 074 061 000 Old_age Always - 26 (Lifetime Min/Max 25/28) 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 5147 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 12 200 Multi_Zone_Error_Rate 0x000a 099 099 000 Old_age Always - 4307 201 Soft_Read_Error_Rate 0x000a 253 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.