Portál AbcLinuxu, 24. října 2025 08:23
smartctl -t long /dev/hda
jsem si vytáhl SMART informace o disku. Výsledkem bylo, že harddisk prošel testem, viz
SMART overall-health self-assessment test result: PASSED.
Chápu, co určují hodnoty Reallocated_Event_Count, Current_Pending_Sector a Offline_Uncorrectable. Nevím, co udává hodnota UDMA_CRC_Error_Count a jaká je její závažnost.
Dále mi není jasné, co znamenají chyby (celkem 9), které se zapsaly do logu (viz dolní část výpisu), přitom disk prošel testem.
V manpage smartctl jsem našel význam zkratek, které jsou ve výpise uvedeny, ale úplně nechápu jejich význam a vliv na funkčnost harddisku.
ABRT: Command ABoRTed ICRC: Interface Cyclic Redundancy Code (CRC) errorBude harddisk fungovat dál v pořádku nebo je to důvod k reklamaci? Díky za odpovědi. Výpis smartctl:
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Device Model: Hitachi HDT725032VLAT80
Serial Number: VF1200R2CRL2SA
Firmware Version: V54OA42A
User Capacity: 320 072 933 376 bytes
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1
Local Time is: Sat May 26 15:47:57 2007 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (5601) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 94) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 117 117 024 Pre-fail Always - 336 (Average 303)
4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 204
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 1912
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 198
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 304
193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 304
194 Temperature_Celsius 0x0002 136 136 000 Old_age Always - 44 (Lifetime Min/Max 21/48)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1425
SMART Error Log Version: 1
ATA Error Count: 9 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 9 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f 02 00 e0 00 00:02:28.700 READ DMA EXT
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
10 00 3f 00 00 00 e0 00 00:02:28.500 RECALIBRATE [OBS-4]
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
Error 8 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
10 00 3f 00 00 00 e0 00 00:02:28.500 RECALIBRATE [OBS-4]
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
25 00 00 3f 00 00 e0 00 00:02:28.500 READ DMA EXT
Error 7 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
25 00 00 3f 00 00 e0 00 00:02:28.500 READ DMA EXT
ea 00 00 00 00 00 e0 00 00:02:28.500 FLUSH CACHE EXIT
25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT
Error 6 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT
25 00 00 3f 00 00 e0 00 00:02:28.500 READ DMA EXT
ea 00 00 00 00 00 e0 00 00:02:28.500 FLUSH CACHE EXIT
25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT
10 00 3f 00 00 00 e0 00 00:02:28.300 RECALIBRATE [OBS-4]
Error 5 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
84 51 00 5e 00 00 e0 Error: ICRC, ABRT at LBA = 0x0000005e = 94
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT
25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT
ea 00 00 00 00 00 e0 00 00:02:26.300 FLUSH CACHE EXIT
25 00 08 a8 ea 42 e0 00 00:02:26.300 READ DMA EXT
ea 00 00 00 00 00 e0 00 00:02:26.300 FLUSH CACHE EXIT
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 1912 -
# 2 Extended offline Completed without error 00% 1910 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Tiskni
Sdílej:
ISSN 1214-1267, (c) 1999-2007 Stickfish s.r.o.