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Zdravim linux komunitu.
Mam jeden dost "osemetny" problem na jednom serveri.
Mam na nom 4 disky zapojene ako JBOD pole.
Vsetko fungovalo donedavna dobre az do kym mi smartd nezacal pisat do syslogu taketo hlasky:
------------------------------
Dec 11 21:09:42 Horus smartd[2305]: Device: /dev/sdb, 1 Currently unreadable (pending) sectors
Dec 11 21:39:42 Horus smartd[2305]: Device: /dev/sdb, 1 Currently unreadable (pending) sectors
Dec 11 22:00:03 Horus syslogd 1.4.1: restart.
Dec 11 22:09:43 Horus smartd[2305]: Device: /dev/sdb, 1 Currently unreadable (pending) sectors
Dec 11 22:39:43 Horus smartd[2305]: Device: /dev/sdb, 1 Currently unreadable (pending) sectors
-------------------------------

Tak som zacal patrat. Na disku SDB som spustil cez:
#smartctl -t long /dev/sdb
long self-test diagnostiku a momentalne je vysledok takyto: (vid nizsie)

CHCEM POZIADAT O RADU. JA V TYCH VYSLEDKOCH NEVIDIM ZIADEN PROBLEM. AKY DALSI (BEZPECNY) TEST BY SOM MAL SPUSTIT AK SI NECHCEM ROZBIT CELE POLE A NEPRIST O DATA NA NOM... ? RESP: KDE BY ESTE MOHOL BYT PROBLEM? DAKUJEM MOC!!!

Vysledok: smartctl -a -d ata /dev/sdb
-------------------------------------------------------------
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG HD501LJ
Serial Number: S0MUJ1KP216526
Firmware Version: CR100-10
User Capacity: 500,107,862,016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Not recognized. Minor revision code: 0x52
Local Time is: Wed Dec 12 08:39:56 2007 CET
==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details.

SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x03) Offline data collection activity is in progress. Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run.
Total time to complete Offline data collection: (8740) seconds.
Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported. General Purpose Logging supported.
Short self-test routine recommended polling time: ( 2) minutes.
Extended self-test routine recommended polling time: ( 149) minutes.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 52
3 Spin_Up_Time 0x0007 100 100 015 Pre-fail Always - 7232
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 34
5 Reallocated_Sector_Ct 0x0033 253 253 010 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 12054
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 4276
10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 34
187 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 524288
188 Unknown_Attribute 0x0032 253 253 000 Old_age Always - 0
190 Unknown_Attribute 0x0022 073 063 000 Old_age Always - 27
194 Temperature_Celsius 0x0022 157 127 000 Old_age Always - 27
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 221990551
196 Reallocated_Event_Count 0x0032 253 253 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 1
198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0
202 TA_Increase_Count 0x0032 253 253 000 Old_age Always - 0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 4270 -

SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1
SMART Selective self-test log data structure revision number 0
Warning: ATA Specification requires selective self-test log data structure revision number = 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.