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smartctl -t long /dev/hda
jsem si vytáhl SMART informace o disku. Výsledkem bylo, že harddisk prošel testem, viz
SMART overall-health self-assessment test result: PASSED
.
Chápu, co určují hodnoty Reallocated_Event_Count, Current_Pending_Sector a Offline_Uncorrectable. Nevím, co udává hodnota UDMA_CRC_Error_Count a jaká je její závažnost.
Dále mi není jasné, co znamenají chyby (celkem 9), které se zapsaly do logu (viz dolní část výpisu), přitom disk prošel testem.
V manpage smartctl jsem našel význam zkratek, které jsou ve výpise uvedeny, ale úplně nechápu jejich význam a vliv na funkčnost harddisku.
ABRT: Command ABoRTed ICRC: Interface Cyclic Redundancy Code (CRC) errorBude harddisk fungovat dál v pořádku nebo je to důvod k reklamaci? Díky za odpovědi. Výpis smartctl:
smartctl version 5.36 [i686-pc-linux-gnu] Copyright (C) 2002-6 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: Hitachi HDT725032VLAT80 Serial Number: VF1200R2CRL2SA Firmware Version: V54OA42A User Capacity: 320 072 933 376 bytes Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 1 Local Time is: Sat May 26 15:47:57 2007 CEST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (5601) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 94) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000b 100 100 016 Pre-fail Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 117 117 024 Pre-fail Always - 336 (Average 303) 4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 204 5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 020 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 1912 10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 198 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 304 193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 304 194 Temperature_Celsius 0x0002 136 136 000 Old_age Always - 44 (Lifetime Min/Max 21/48) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 1425 SMART Error Log Version: 1 ATA Error Count: 9 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 9 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 3f 02 00 e0 00 00:02:28.700 READ DMA EXT 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 10 00 3f 00 00 00 e0 00 00:02:28.500 RECALIBRATE [OBS-4] 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT Error 8 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 10 00 3f 00 00 00 e0 00 00:02:28.500 RECALIBRATE [OBS-4] 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 25 00 00 3f 00 00 e0 00 00:02:28.500 READ DMA EXT Error 7 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 25 00 00 3f 00 00 e0 00 00:02:28.500 READ DMA EXT ea 00 00 00 00 00 e0 00 00:02:28.500 FLUSH CACHE EXIT 25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT Error 6 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 3e 03 00 e0 Error: ICRC, ABRT at LBA = 0x0000033e = 830 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 00 3f 02 00 e0 00 00:02:28.500 READ DMA EXT 25 00 00 3f 00 00 e0 00 00:02:28.500 READ DMA EXT ea 00 00 00 00 00 e0 00 00:02:28.500 FLUSH CACHE EXIT 25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT 10 00 3f 00 00 00 e0 00 00:02:28.300 RECALIBRATE [OBS-4] Error 5 occurred at disk power-on lifetime: 1908 hours (79 days + 12 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 00 5e 00 00 e0 Error: ICRC, ABRT at LBA = 0x0000005e = 94 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT 25 00 20 3f 00 00 e0 00 00:02:28.300 READ DMA EXT ea 00 00 00 00 00 e0 00 00:02:26.300 FLUSH CACHE EXIT 25 00 08 a8 ea 42 e0 00 00:02:26.300 READ DMA EXT ea 00 00 00 00 00 e0 00 00:02:26.300 FLUSH CACHE EXIT SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 1912 - # 2 Extended offline Completed without error 00% 1910 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.
Tiskni
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