Dotaz: [Smart výstup] Je tento disk ok?

[z_sk]

Je tento disk ok, v dobrom stave?

smartctl 7.2 2020-12-30 r5155 [x86_64-linux-5.15.0-2-amd64] (local build)
Copyright (C) 2002-20, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Model Family:     Toshiba 2.5" HDD MQ01ABF...
Device Model:     TOSHIBA MQ01ABF050
Serial Number:    X6I6SAUVS
LU WWN Device Id: 5 000039 7558860a3
Firmware Version: AM0P2D
User Capacity:    500 107 862 016 bytes [500 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    5400 rpm
Form Factor:      2.5 inches
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   ATA8-ACS (minor revision not indicated)
SATA Version is:  SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s)
Local Time is:    Sat Dec 18 16:48:17 2021 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  120) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 119) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 128
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0
  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       1339
  5 Reallocated_Sector_Ct   0x0033   100   100   050    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   090   090   000    Old_age   Always       -       4354
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       2256
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       23
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       266
193 Load_Cycle_Count        0x0032   097   097   000    Old_age   Always       -       35881
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       30 (Min/Max 11/50)
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
240 Head_Flying_Hours       0x0032   090   090   000    Old_age   Always       -       4198
241 Total_LBAs_Written      0x0032   100   100   000    Old_age   Always       -       8631177087
242 Total_LBAs_Read         0x0032   100   100   000    Old_age   Always       -       11469028661
254 Free_Fall_Sensor        0x0032   100   100   000    Old_age   Always       -       2

SMART Error Log Version: 1
ATA Error Count: 2
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 2577 hours (107 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 41 50 bf 1a 9a 40  Error: ICRC, ABRT at LBA = 0x009a1abf = 10099391

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  61 40 50 80 15 9a 40 00      00:36:43.881  WRITE FPDMA QUEUED
  61 40 48 40 10 9a 40 00      00:36:43.870  WRITE FPDMA QUEUED
  61 40 38 00 0b 9a 40 00      00:36:43.860  WRITE FPDMA QUEUED
  61 40 30 c0 05 9a 40 00      00:36:43.852  WRITE FPDMA QUEUED
  61 40 28 80 00 9a 40 00      00:36:43.841  WRITE FPDMA QUEUED

Error 1 occurred at disk power-on lifetime: 2576 hours (107 days + 8 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  84 41 f8 ff d7 a8 40  Error: ICRC, ABRT at LBA = 0x00a8d7ff = 11065343

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  61 40 f8 c0 d2 a8 40 00      00:30:33.516  WRITE FPDMA QUEUED
  61 40 08 80 cd a8 40 00      00:30:33.511  WRITE FPDMA QUEUED
  61 40 00 40 c8 a8 40 00      00:30:33.504  WRITE FPDMA QUEUED
  61 40 f0 00 c3 a8 40 00      00:30:33.498  WRITE FPDMA QUEUED
  61 40 b8 c0 bd a8 40 00      00:30:33.491  WRITE FPDMA QUEUED

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%      4354         -
# 2  Short offline       Completed without error       00%      1307         -
# 3  Short offline       Completed without error       00%         0         -
# 4  Short offline       Aborted by host               90%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

---

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Odpovědi

[Pavel 'TIGER' Růžička]

Vypadá, že ano.

[R]

Ano.

[X]

Ok.

[Peter Golis]

Pustil by som naň dlhý test.

[Bhezret]

Treba vykonávať test pri normálnej prevádzke alebo pri nič-nerobení.

[k3dAR]

To je jedno, hlavne to nevypnout/uspat pred dokoncenim samozrejme ze pri tvem cteni/zapisu bude test trvat dele... Ale projevile by se to spis nez normalni, pri abnormalni prevadzke

[Heron]

Nelze říci. Chce to určitě long test. Test lze vykonávat během provozu. A chce to jej nechat doběhnout do konce. A teplota 50°C se mi moc nelíbí. Toshiba umí dobrý disky, proto rovnou nepíšu, že jej máš reklamovat. Udělej long test a potom se uvidí.

[Max]

Teplota záleží na chlazení / větrání skříně, což je pro nás velká neznámá.
Jinak souhlas, pár testů by si to ještě zasloužilo.
Zdar Max

[Bhezret]

Příloha:

• long_test.txt (6932 bytů)

V prílohe je po long teste.

[trubicoid2]

Patrně je to zatím v pohodě. Ty dvě chyby v logu jsou při zápise a v 2700 hodin, kdežto teď je už 4300 hodin. Taky jsou tam nějaký pády (free-fall a G-sensor).